A collision resistant deterministic random bit generator with fault attack detection possibilities

E. Bohl, M. Lewis, K. Damm. A collision resistant deterministic random bit generator with fault attack detection possibilities. In Giorgio Di Natale, editor, 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014. pages 1-2, IEEE, 2014. [doi]

@inproceedings{BohlLD14,
  title = {A collision resistant deterministic random bit generator with fault attack detection possibilities},
  author = {E. Bohl and M. Lewis and K. Damm},
  year = {2014},
  doi = {10.1109/ETS.2014.6847829},
  url = {http://dx.doi.org/10.1109/ETS.2014.6847829},
  researchr = {https://researchr.org/publication/BohlLD14},
  cites = {0},
  citedby = {0},
  pages = {1-2},
  booktitle = {19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014},
  editor = {Giorgio Di Natale},
  publisher = {IEEE},
}