Kevin Böhmer, Bruno Forlin, Carlo Cazzaniga, Paolo Rech, Gianluca Furano, Nikolaos Alachiotis 0001, Marco Ottavi. Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs. In Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023. pages 1-6, IEEE, 2023. [doi]
@inproceedings{BohmerFCRFAO23, title = {Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs}, author = {Kevin Böhmer and Bruno Forlin and Carlo Cazzaniga and Paolo Rech and Gianluca Furano and Nikolaos Alachiotis 0001 and Marco Ottavi}, year = {2023}, doi = {10.1109/DFT59622.2023.10313556}, url = {https://doi.org/10.1109/DFT59622.2023.10313556}, researchr = {https://researchr.org/publication/BohmerFCRFAO23}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023}, editor = {Luca Cassano and Mihalis Psarakis and Marcello Traiola and Alberto Bosio}, publisher = {IEEE}, isbn = {979-8-3503-1500-4}, }