Test-Driven Porting

Ralph Bohnet, Gerard Meszaros. Test-Driven Porting. In AGILE 2005 Conference (AGILE 2005), 24-29 July 2005, Denver, CO, USA. pages 259-266, IEEE Computer Society, 2005. [doi]

@inproceedings{BohnetM05,
  title = {Test-Driven Porting},
  author = {Ralph Bohnet and Gerard Meszaros},
  year = {2005},
  doi = {10.1109/ADC.2005.46},
  url = {http://doi.ieeecomputersociety.org/10.1109/ADC.2005.46},
  tags = {testing},
  researchr = {https://researchr.org/publication/BohnetM05},
  cites = {0},
  citedby = {0},
  pages = {259-266},
  booktitle = {AGILE 2005 Conference (AGILE 2005), 24-29 July 2005, Denver, CO, USA},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-2487-7},
}