Reliability-Driven System-Level Synthesis of Embedded Systems

Cristiana Bolchini, Antonio Miele. Reliability-Driven System-Level Synthesis of Embedded Systems. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 35-43, IEEE Computer Society, 2010. [doi]

Authors

Cristiana Bolchini

This author has not been identified. Look up 'Cristiana Bolchini' in Google

Antonio Miele

This author has not been identified. Look up 'Antonio Miele' in Google