A Visual Approach to Spot Statistically-Significant Differences in Event Logs Based on Process Metrics

Alfredo Bolt, Massimiliano de Leoni, Wil M. P. van der Aalst. A Visual Approach to Spot Statistically-Significant Differences in Event Logs Based on Process Metrics. In Selmin Nurcan, Pnina Soffer, Marko Bajec, Johann Eder, editors, Advanced Information Systems Engineering - 28th International Conference, CAiSE 2016, Ljubljana, Slovenia, June 13-17, 2016. Proceedings. Volume 9694 of Lecture Notes in Computer Science, pages 151-166, Springer, 2016. [doi]

Abstract

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