Massimo Bombana, Giacomo Buonanno, Patrizia Cavalloro, Fabrizio Ferrandi, Donatella Sciuto, Giuseppe Zaza. An Expert Solution to Functional Testability Analysis of VLSI Circuits. In SEKE 93, The 5th International Conference on Software Engineering and Knowledge Engineering, Tutorials, June 14-15, 1993, Technical Program, June 16-18, 1993, Hotel Sofitel, San Francisco Bay, USA. pages 263-265, Knowledge Systems Institute, 1993.
@inproceedings{BombanaBCFSZ93,
title = {An Expert Solution to Functional Testability Analysis of VLSI Circuits},
author = {Massimo Bombana and Giacomo Buonanno and Patrizia Cavalloro and Fabrizio Ferrandi and Donatella Sciuto and Giuseppe Zaza},
year = {1993},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/BombanaBCFSZ93},
cites = {0},
citedby = {0},
pages = {263-265},
booktitle = {SEKE 93, The 5th International Conference on Software Engineering and Knowledge Engineering, Tutorials, June 14-15, 1993, Technical Program, June 16-18, 1993, Hotel Sofitel, San Francisco Bay, USA},
publisher = {Knowledge Systems Institute},
}