Test-Plan Optimization for Flying-Probes In-Circuit Testers - researchr publication authors

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Luciano Bonaria, Maurizio Raganato, Giovanni Squillero, Matteo Sonza Reorda. Test-Plan Optimization for Flying-Probes In-Circuit Testers. In IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019. pages 19-24, IEEE, 2019. [doi]

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