Oxide-Tunneling Leakage Suppressed SRAM for Sub-65-nm Very Large Scale Integrated Circuits

Ji-Hye Bong, Kwan-Hee Jo, Kyeong-Sik Min, Sung-Mo Kang. Oxide-Tunneling Leakage Suppressed SRAM for Sub-65-nm Very Large Scale Integrated Circuits. J. Low Power Electronics, 7(1):87-95, 2011. [doi]

Abstract

Abstract is missing.