Andrea Boni, Andrea Pierazzi. Yield Enhancement by Multi-level Linear Modeling of Non-Idealities in an Interpolated Flash ADCs. In 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings. pages 326-334, IEEE Computer Society, 1998. [doi]
Abstract is missing.