Piotr Boniecki, Krzysztof Koszela, Hanna Piekarska-Boniecka, Krzysztof Nowakowski, Jacek Przybyl, Maciej Zaborowicz, Barbara Raba, Jacek Dach. Identification of selected apple pests based on selected graphical parameters. In Yulin Wang, Xie Yi, editors, Fifth International Conference on Digital Image Processing, ICDIP 2013, Beijing, China, April 21-22, 2013. Volume 8878 of SPIE Proceedings, SPIE, 2013. [doi]
Abstract is missing.