Vamsi Boppana, W. Kent Fuchs. Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits. In ICCAD. pages 147-154, 1998. [doi]
@inproceedings{BoppanaF98:0, title = {Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits}, author = {Vamsi Boppana and W. Kent Fuchs}, year = {1998}, doi = {10.1145/288548.288593}, url = {http://doi.acm.org/10.1145/288548.288593}, tags = {testing, diagnostics}, researchr = {https://researchr.org/publication/BoppanaF98%3A0}, cites = {0}, citedby = {0}, pages = {147-154}, booktitle = {ICCAD}, }