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Automatic process for time-frequency scan of VLSI

Anthony Boscaro, Sabir Jacquir, K. Melendez, Kevin Sanchez, Philippe Perdu, Stéphane Binczak. Automatic process for time-frequency scan of VLSI. Microelectronics Reliability, 64:299-305, 2016. [doi]

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Anthony Boscaro

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Sabir Jacquir

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K. Melendez

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Kevin Sanchez

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Philippe Perdu

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Stéphane Binczak

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