Anthony Boscaro, Sabir Jacquir, K. Melendez, Kevin Sanchez, Philippe Perdu, Stéphane Binczak. Automatic process for time-frequency scan of VLSI. Microelectronics Reliability, 64:299-305, 2016. [doi]
@article{BoscaroJMSPB16,
title = {Automatic process for time-frequency scan of VLSI},
author = {Anthony Boscaro and Sabir Jacquir and K. Melendez and Kevin Sanchez and Philippe Perdu and Stéphane Binczak},
year = {2016},
doi = {10.1016/j.microrel.2016.07.052},
url = {http://dx.doi.org/10.1016/j.microrel.2016.07.052},
researchr = {https://researchr.org/publication/BoscaroJMSPB16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {64},
pages = {299-305},
}