Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak. Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory. In 20th International Conference on Information Fusion, FUSION 2017, Xi'an, China, July 10-13, 2017. pages 1-8, IEEE, 2017. [doi]
Abstract is missing.