R. P. Jagadeesh Chandra Bose, Wil M. P. van der Aalst. Context Aware Trace Clustering: Towards Improving Process Mining Results. In Proceedings of the SIAM International Conference on Data Mining, SDM 2009, April 30 - May 2, 2009, Sparks, Nevada, USA. pages 401-412, SIAM, 2009. [doi]
Abstract is missing.