Trace Alignment in Process Mining: Opportunities for Process Diagnostics

R. P. Jagadeesh Chandra Bose, Wil M. P. van der Aalst. Trace Alignment in Process Mining: Opportunities for Process Diagnostics. In Richard Hull, Jan Mendling, Stefan Tai, editors, Business Process Management - 8th International Conference, BPM 2010, Hoboken, NJ, USA, September 13-16, 2010. Proceedings. Volume 6336 of Lecture Notes in Computer Science, pages 227-242, Springer, 2010. [doi]

Abstract

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