Alberto Bosio, Patrick Girard 0001, Arnaud Virazel. Test of low power circuits: Issues and industrial practices. In 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016. pages 524-527, IEEE, 2016. [doi]
@inproceedings{Bosio0V16, title = {Test of low power circuits: Issues and industrial practices}, author = {Alberto Bosio and Patrick Girard 0001 and Arnaud Virazel}, year = {2016}, doi = {10.1109/ICECS.2016.7841254}, url = {http://dx.doi.org/10.1109/ICECS.2016.7841254}, researchr = {https://researchr.org/publication/Bosio0V16}, cites = {0}, citedby = {0}, pages = {524-527}, booktitle = {2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016}, publisher = {IEEE}, isbn = {978-1-5090-6113-6}, }