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A Reliability Analysis of a Deep Neural Network

Alberto Bosio, Paolo Bernardi, Annachiara Ruospo, Ernesto Sánchez 0001. A Reliability Analysis of a Deep Neural Network. In IEEE Latin American Test Symposium, LATS 2019, Santiago, Chile, March 11-13, 2019. pages 1-6, IEEE, 2019. [doi]

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