Douglas C. Bossen, Daniel L. Ostapko, Arvind M. Patel. Optimum test patterns for parity networks. In American Federation of Information Processing Societies: Proceedings of the AFIPS '70 Fall Joint Computer Conference, November 17-19, 1970, Houston, Texas, USA. Volume 37 of AFIPS Conference Proceedings, pages 63-68, AFIPS / ACM, 1970. [doi]
Abstract is missing.