Sebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura. Low V_D_D vs. Delay: Is it Really a Good Correlation Metric for Nanometer ICs?. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 358-363, IEEE Computer Society, 2006. [doi]
Abstract is missing.