Cross-BIC architecture for single and multiple SEU detection enhancement in SRAM memories - researchr publication authors

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Sebastiàn A. Bota, Gabriel Torrens, Bartomeu Alorda, J. Verd, Jaume Segura. Cross-BIC architecture for single and multiple SEU detection enhancement in SRAM memories. In 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 5-7 July, 2010, Corfu, Greece. pages 141-146, IEEE, 2010. [doi]

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