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Achieving SCA Conformance Testing with Model-Based Testing

Julien Botella, Jean-Philippe Delahaye, Eddie Jaffuel, Bruno Legeard, Fabien Peureux. Achieving SCA Conformance Testing with Model-Based Testing. VLSI Signal Processing, 83(1):113-128, 2016. [doi]

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Julien Botella

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Jean-Philippe Delahaye

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Eddie Jaffuel

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Bruno Legeard

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Fabien Peureux

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