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Peter S. Bottorff, Richard E. France, N. H. Garges, E. J. Orosz. Test generation for large logic networks. In Judith G. Brinsfield, Stephen A. Szygenda, David W. Hightower, editors, Proceedings of the 14th Design Automation Conference, DAC '77, New Orleans, Louisiana, USA, June 20-22, 1977. pages 479-485, ACM, 1977. [doi]

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