An automatic system approach to the problem of memory circuit testing & fault diagnosis

Peter S. Bottorff, Mitchel E. Schwass, Francis J. Villante. An automatic system approach to the problem of memory circuit testing & fault diagnosis. In Ralph J. Preiss, editor, Proceedings of the 7th Design Automation Workshop, DAC '70, San Francisco, California, USA, June 22-25, 1970. pages 95-99, ACM, 1970. [doi]

Abstract

Abstract is missing.