Samir Boubezari, Bozena Kaminska. A new reconfigurable Test Vector Generator for built-in self-test applications. J. Electronic Testing, 8(2):153-164, 1996. [doi]
@article{BoubezariK96,
title = {A new reconfigurable Test Vector Generator for built-in self-test applications},
author = {Samir Boubezari and Bozena Kaminska},
year = {1996},
doi = {10.1007/BF02341821},
url = {http://dx.doi.org/10.1007/BF02341821},
tags = {testing},
researchr = {https://researchr.org/publication/BoubezariK96},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {8},
number = {2},
pages = {153-164},
}