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Half-occluded regions: The key to detecting a diverse array of defects in S3D imagery

Jonathan Bouchard, James J. Clark. Half-occluded regions: The key to detecting a diverse array of defects in S3D imagery. In International Conference on 3D Immersion, IC3D 2017, Brussels, Belgium, December 11-12, 2017. pages 1-8, IEEE, 2017. [doi]

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