Ahcène Bounceur, Belkacem Brahmi, Kamel Beznia, Reinhardt Euler. Accurate analog/RF BIST evaluation based on SVM classification of the process parameters. In 9th International Design and Test Symposium, IDT 2014, Algeries, Algeria, December 16-18, 2014. pages 55-60, IEEE, 2014. [doi]
Abstract is missing.