Youcef Bourai, C.-J. Richard Shi. Layout Compaction for Yield Optimization via Critical Area Minimization. In 2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France. pages 122, IEEE Computer Society, 2000. [doi]
@inproceedings{BouraiS00,
title = {Layout Compaction for Yield Optimization via Critical Area Minimization},
author = {Youcef Bourai and C.-J. Richard Shi},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/date/2000/0537/00/05370122abs.htm},
tags = {optimization, layout, C++},
researchr = {https://researchr.org/publication/BouraiS00},
cites = {0},
citedby = {0},
pages = {122},
booktitle = {2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-0537-6},
}