Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications - researchr publication authors

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M. L. Bourqui, L. Béchou, Olivier Gilard, Y. Deshayes, P. Del Vecchio, L. S. How, F. Rosala, Y. Ousten, A. Touboul. Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications. Microelectronics Reliability, 48(8-9):1202-1207, 2008. [doi]

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