Mouade Bouydain, Jose F. Colom, Joan Anto, Josep M. Pladellorens. Surface characterization using confocal microscopy and wavelet transform analysis. In Brian D. Corner, Joseph H. Nurre, Roy P. Pargas, editors, Proceedings of the Conference on Three-Dimensional Image Capture and Applications IV, San Jose, CA, USA, January 20, 2001. Volume 4298 of SPIE Proceedings, pages 187-194, SPIE, 2001. [doi]
Abstract is missing.