David Bowes, Tracy Hall, Jean Petric. Different Classifiers Find Different Defects Although With Different Level of Consistency. In Ayse Bener, Leandro L. Minku, Burak Turhan, editors, Proceedings of the 11th International Conference on Predictive Models and Data Analytics in Software Engineering, PROMISE, Beijing, China, October 21 - 21, 2015. pages 3, ACM, 2015. [doi]
@inproceedings{BowesHP15,
title = {Different Classifiers Find Different Defects Although With Different Level of Consistency},
author = {David Bowes and Tracy Hall and Jean Petric},
year = {2015},
doi = {10.1145/2810146.2810149},
url = {http://doi.acm.org/10.1145/2810146.2810149},
researchr = {https://researchr.org/publication/BowesHP15},
cites = {0},
citedby = {0},
pages = {3},
booktitle = {Proceedings of the 11th International Conference on Predictive Models and Data Analytics in Software Engineering, PROMISE, Beijing, China, October 21 - 21, 2015},
editor = {Ayse Bener and Leandro L. Minku and Burak Turhan},
publisher = {ACM},
isbn = {978-1-4503-3715-1},
}