David Bowes, Tracy Hall, Jean Petric. Different Classifiers Find Different Defects Although With Different Level of Consistency. In Ayse Bener, Leandro L. Minku, Burak Turhan, editors, Proceedings of the 11th International Conference on Predictive Models and Data Analytics in Software Engineering, PROMISE, Beijing, China, October 21 - 21, 2015. pages 3, ACM, 2015. [doi]
Abstract is missing.