A 7nm Leakage-Current-Supply Circuit for LDO Dropout Voltage Reduction

Keith A. Bowman, Samantak Gangopadhyay, Francois Atallah, Hoan Nguyen, Jihoon Jeong, Daniel Yingling, Anthony Polomik, Mahesh Harinath, Nathaniel Reeves, Amer Cassier, Brad Appel, Arijit Raychowdhury. A 7nm Leakage-Current-Supply Circuit for LDO Dropout Voltage Reduction. In 2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019. pages 126, IEEE, 2019. [doi]

@inproceedings{BowmanGANJYPHRC19,
  title = {A 7nm Leakage-Current-Supply Circuit for LDO Dropout Voltage Reduction},
  author = {Keith A. Bowman and Samantak Gangopadhyay and Francois Atallah and Hoan Nguyen and Jihoon Jeong and Daniel Yingling and Anthony Polomik and Mahesh Harinath and Nathaniel Reeves and Amer Cassier and Brad Appel and Arijit Raychowdhury},
  year = {2019},
  doi = {10.23919/VLSIC.2019.8778148},
  url = {https://doi.org/10.23919/VLSIC.2019.8778148},
  researchr = {https://researchr.org/publication/BowmanGANJYPHRC19},
  cites = {0},
  citedby = {0},
  pages = {126},
  booktitle = {2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019},
  publisher = {IEEE},
  isbn = {978-4-86348-720-8},
}