Quentin Boyadjian, Nicolas Vanderesse, Matthew Toews, Philippe Bocher. Detecting Defects in Materials Using Deep Convolutional Neural Networks. In Aurélio Campilho, Fakhri Karray, Zhou Wang, editors, Image Analysis and Recognition - 17th International Conference, ICIAR 2020, Póvoa de Varzim, Portugal, June 24-26, 2020, Proceedings, Part I. Volume 12131 of Lecture Notes in Computer Science, pages 293-306, Springer, 2020. [doi]
Abstract is missing.