D. Boyd, D. Cura, Willa K. Ehrlich, R. Gotberg, Rema Hariharan, Paul Reeser. Contributing to the Bottom Line: Optimizing Reliability-Cost-Schedule Tradeoff and Architecture Scalability through Test Technology. In 11th International Symposium on Software Reliability Engineering (ISSRE 2000), 8-11 October 2000, San Jose, CA, USA. pages 136-147, IEEE Computer Society, 2000. [doi]
Abstract is missing.