Alexandre Boyer, M. Cavarroc. Enhancement of the spatial resolution of near-field immunity maps. In 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2015, Edinburgh, UK, November 10-13, 2015. pages 163-168, IEEE, 2015. [doi]
@inproceedings{BoyerC15,
title = {Enhancement of the spatial resolution of near-field immunity maps},
author = {Alexandre Boyer and M. Cavarroc},
year = {2015},
doi = {10.1109/EMCCompo.2015.7358350},
url = {https://doi.org/10.1109/EMCCompo.2015.7358350},
researchr = {https://researchr.org/publication/BoyerC15},
cites = {0},
citedby = {0},
pages = {163-168},
booktitle = {10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2015, Edinburgh, UK, November 10-13, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7897-0},
}