Ludovic Boyer, Olivier Fruchier, Petru Notingher, Serge Agnel, Alain Toureille, Bernard Rousset, Jean-Louis Sanchez. Analysis of Data Obtained Using the Thermal Step Method on a MOS Structure - An Electrostatic Approach. In Industry Applications Society Annual Meeting, IAS 2008, Edmonton, Alberta, Canada, 5-9 Octobert, 2008. pages 1-6, IEEE, 2008. [doi]
@inproceedings{BoyerFNATRS08,
title = {Analysis of Data Obtained Using the Thermal Step Method on a MOS Structure - An Electrostatic Approach},
author = {Ludovic Boyer and Olivier Fruchier and Petru Notingher and Serge Agnel and Alain Toureille and Bernard Rousset and Jean-Louis Sanchez},
year = {2008},
doi = {10.1109/08IAS.2008.111},
url = {http://dx.doi.org/10.1109/08IAS.2008.111},
researchr = {https://researchr.org/publication/BoyerFNATRS08},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {Industry Applications Society Annual Meeting, IAS 2008, Edmonton, Alberta, Canada, 5-9 Octobert, 2008},
publisher = {IEEE},
isbn = {978-1-4244-2278-4},
}