Ludovic Boyer, Olivier Fruchier, Petru Notingher, Serge Agnel, Alain Toureille, Bernard Rousset, Jean-Louis Sanchez. Analysis of Data Obtained Using the Thermal Step Method on a MOS Structure - An Electrostatic Approach. In Industry Applications Society Annual Meeting, IAS 2008, Edmonton, Alberta, Canada, 5-9 Octobert, 2008. pages 1-6, IEEE, 2008. [doi]
Abstract is missing.