Ludovic Boyer, Petru Notingher, Serge Agnel, Bernard Rousset, Jean-Louis Sanchez. Measurement of Charge Evolution in Oxides of DC Stressed MOS Structures. In Annual Meeting of the IEEE Industry Applications Society, IAS 2010, Houston, TX, USA, 3-7 October, 2010, Proceedings. pages 1-8, IEEE, 2010. [doi]
Abstract is missing.