Rick Boyle, Jack Donovan, Eugene R. Hnatek, Alex M. Ijaz. Application of Statistical Techniques to Critical System Parameters. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 108-114, IEEE Computer Society, 1993.
@inproceedings{BoyleDHI93,
title = {Application of Statistical Techniques to Critical System Parameters},
author = {Rick Boyle and Jack Donovan and Eugene R. Hnatek and Alex M. Ijaz},
year = {1993},
researchr = {https://researchr.org/publication/BoyleDHI93},
cites = {0},
citedby = {0},
pages = {108-114},
booktitle = {Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993},
publisher = {IEEE Computer Society},
isbn = {0-7803-1430-1},
}