Shane Bracher, Mark Holmes, Liam Mischewski, Asadul K. Islam, Michael McClenaghan, Daniel Ricketts, Glenn Neuber, Hoyoung Jeung, Priya Vijayarajendran. Advanced analytics on SAP HANA: Churn risk scoring using call network analysis. In Johannes Gehrke, Wolfgang Lehner, Kyuseok Shim, Sang Kyun Cha, Guy M. Lohman, editors, 31st IEEE International Conference on Data Engineering, ICDE 2015, Seoul, South Korea, April 13-17, 2015. pages 1400-1403, IEEE, 2015. [doi]
Abstract is missing.