Experimental Verification and Evaluation of Non-Stateful Logic Gates in Resistive RAM

Leon Brackmann, Tobias Ziegler 0005, Dirk J. Wouters, Stephan Menzel. Experimental Verification and Evaluation of Non-Stateful Logic Gates in Resistive RAM. IEEE Trans. Circuits Syst. I Regul. Pap., 72(5):2029-2038, May 2025. [doi]

Abstract

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