Laser induced impact ionization effect in MOSFET during 1064 nm laser stimulation

Sanjib Kumar Brahma, Arkadiusz Glowacki, Reiner Leihkauf, Christian Boit. Laser induced impact ionization effect in MOSFET during 1064 nm laser stimulation. Microelectronics Reliability, 51(9-11):1652-1657, 2011. [doi]

Abstract

Abstract is missing.