J. Brandelero, Bernardo Cougo, Thierry Meynard, N. Videau. A non-intrusive method for measuring switching losses of GaN power transistors. In IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society, Vienna, Austria, November 10-13, 2013. pages 246-251, IEEE, 2013. [doi]
Abstract is missing.