High-Performance Production Test Contractors for Fine-Pitch Integrated Circuits

James J. Brandes. High-Performance Production Test Contractors for Fine-Pitch Integrated Circuits. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 518-526, IEEE Computer Society, 1997.

@inproceedings{Brandes97,
  title = {High-Performance Production Test Contractors for Fine-Pitch Integrated Circuits},
  author = {James J. Brandes},
  year = {1997},
  tags = {testing},
  researchr = {https://researchr.org/publication/Brandes97},
  cites = {0},
  citedby = {0},
  pages = {518-526},
  booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
  publisher = {IEEE Computer Society},
  isbn = {0-7803-4209-7},
}