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LĂ©opold Van Brandt, Roghayeh Saeidi, David Bol, Denis Flandre. Accurate and Insightful Closed-Form Prediction of Subthreshold SRAM Hold Failure Rate. IEEE Trans. Circuits Syst. I Regul. Pap., 69(7):2767-2780, 2022. [doi]
Abstract is missing.