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Reliability of Tapered Bimorph Piezoelectric Energy Harvesters - an Experimental Study

J. A. Brans, T. W. A. Blad, N. Tolou. Reliability of Tapered Bimorph Piezoelectric Energy Harvesters - an Experimental Study. In 30th IEEE International Symposium on Industrial Electronics, ISIE 2021, Kyoto, Japan, June 20-23, 2021. pages 1-4, IEEE, 2021. [doi]

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J. A. Brans

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T. W. A. Blad

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N. Tolou

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