J. A. Brans, T. W. A. Blad, N. Tolou. Reliability of Tapered Bimorph Piezoelectric Energy Harvesters - an Experimental Study. In 30th IEEE International Symposium on Industrial Electronics, ISIE 2021, Kyoto, Japan, June 20-23, 2021. pages 1-4, IEEE, 2021. [doi]
Abstract is missing.