A method of thermal testing of microsystems

Piotr Bratek, Andrzej Kos. A method of thermal testing of microsystems. Microelectronics Reliability, 41(11):1877-1887, 2001. [doi]

Authors

Piotr Bratek

This author has not been identified. Look up 'Piotr Bratek' in Google

Andrzej Kos

This author has not been identified. Look up 'Andrzej Kos' in Google