Piotr Bratek, Andrzej Kos. A method of thermal testing of microsystems. Microelectronics Reliability, 41(11):1877-1887, 2001. [doi]
@article{BratekK01,
title = {A method of thermal testing of microsystems},
author = {Piotr Bratek and Andrzej Kos},
year = {2001},
doi = {10.1016/S0026-2714(01)00088-9},
url = {http://dx.doi.org/10.1016/S0026-2714(01)00088-9},
tags = {testing},
researchr = {https://researchr.org/publication/BratekK01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {11},
pages = {1877-1887},
}